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US-8380915-A1
The ECC decoder 322, in one embodiment, provides a known bias and/or a read bias for a data set to the configuration module 352. The ECC decoder 322 may provide a known bias for a data set having a correct state of bits for the data set. For example, once the ECC decoder 322 has corrected one or more correctable bit errors in a data set, the ECC decoder 322 may provide the error corrected state of the bits of the data set to the configuration module 352 as a known bias with which the data set was written to the solid-state storage media 110. The ECC decoder 322, in a further embodiment, may provide the read bias for a data set as an error bias that indicates one or more bits of a data set that were in error when the data set was read from the solid-state storage media 110.
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US-8380915-A1
In one embodiment, the inverse bias module 332 provides a read bias of a data set read from the solid-state storage media 110 to the configuration module 352. For example, as the inverse bias module 332 converts biased data packets or other data sets back to their original source form by reversing the biasing process of the bias module 318, the inverse bias module 332 may determine, measure, or detect the read bias of the data packets or other data sets. The inverse bias module 332 may determine a read bias prior to, during, or after reversing the biasing process, depending on the biasing process used. In certain embodiments, if the inverse bias module 332 determines that a read bias of a data set deviates from the known/expected bias of the data set, the inverse bias module 332 may provide the data set to the configuration module 352 to make a configuration parameter adjustment 358 to storage cells of the data set so that the data set may be re-read. In other embodiments, as described above with regard to FIG. 3A, the configuration module 352 may adjust a read voltage threshold for a data set before the inverse bias module 332 receives the data set. One of skill in the art, in light of this specification, will recognize other arrangements of the configuration module 352, the inverse bias module 332, and the ECC decoder 322, each of which fall within the scope of the present invention.
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US-8380915-A1
In one embodiment, the solid-state storage controller 104 includes a configuration module 352 that sets and adjusts configuration parameters for the solid-state storage media 110, such as read voltage thresholds and the like. In a further embodiment, the configuration module 352 may be integrated with the solid-state storage media 110 such that it operates independently from the read data pipeline 108 and/or the write data pipeline 106. In certain embodiments, as described in greater detail below with regard to the proactive configuration module 424 of FIG. 4 and FIG. 5, the configuration module 352 proactively determines one or more configuration parameters for storage cells of the solid-state storage media 110 based on storage media characteristics for the storage cells in an open loop manner, with little or no feedback from the storage cells. In the depicted embodiment, the configuration module 352 is in communication with the storage control bus 212 and the storage bus controller 348 to configure storage cells of the solid-state storage media 110 to use various configuration parameters. In another embodiment, the configuration module 352 manages configuration parameters and/or settings for the solid-state storage controller 104 and or for the solid-state storage device 102.
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US-8380915-A1
In another embodiment, the inverse bias module 332 may provide the expected bias as a range, a distribution, an average, an estimate, or the like based on the reversible biasing algorithm that the bias module 318 applies to data. For example, the inverse bias module 332 may measure or learn an expected bias over time as the inverse bias module 332 applies an inverse biasing algorithm to data read from the solid-state storage media 110. In one embodiment, the expected bias may be mathematically or otherwise derived from the reversible biasing algorithm of the bias module 318 as a range or distribution of possible or likely biases.
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US-8380915-A1
The inverse bias module 332, in one embodiment, provides a known bias and/or an actual read bias of a data set to the configuration module 352. The inverse bias module 332 may provide the known bias as an expected bias based on a reversible biasing algorithm that the bias module 318 applies to data written to the solid-state storage media 110. The expected bias, in certain embodiments, may be an exact bias, where the bias module 318 uses a reversible biasing algorithm that biases data to exactly match a bias. For example, the bias module 318 may add padding data to a data set so that the data set has an exact balance of binary ones and binary zeroes, or the like, and the known bias may be exact.
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US-8380915-A1
In the depicted embodiment 301, the configuration module 352 receives inputs from the inverse bias module 332, the ECC decoder 322, and the device factor module 354 and the configuration module 352 determines a configuration parameter adjustment 358 based on the inputs. In other embodiments, the configuration module 352 may receive inputs from just the inverse bias module 332, from just the ECC decoder 322, from just the device factor module 354, or from a different combination of the inverse bias module 332, the ECC decoder 322, and/or the device factor module 354.
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US-8380915-A1
FIG. 3B is a schematic block diagram illustrating another embodiment 301 of a solid-state storage controller 104. In the depicted embodiment 301, the solid-state storage controller 104 includes a device factor module 354, the inverse bias module 332, the ECC decoder 322, and the configuration module 352. Although not depicted in FIG. 3B, the solid-state storage controller 104 of the embodiment illustrated in FIG. 3B may also, in certain embodiments, include one or more additional modules or other elements from the solid-state storage controller 104 depicted in FIG. 3A, as described above.
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US-8380915-A1
Configuring Storage Cells
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US-8380915-A1
The solid-state storage controller 104 and or solid-state storage device 102 may also include a bank interleave controller 344, a synchronization buffer 346, a storage bus controller 348, and a multiplexer (“MUX”) 350.
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US-8380915-A1
Commands or instructions may be simultaneously loaded into the control queues 342 for a packet being forwarded to the write data pipeline 106 with each pipeline stage pulling the appropriate command or instruction as the respective packet is executed by that stage. Similarly, commands or instructions may be simultaneously loaded into the control queues 342 for a packet being requested from the read data pipeline 108 with each pipeline stage pulling the appropriate command or instruction as the respective packet is executed by that stage. One of skill in the art will recognize other features and functions of control and status registers 340 and control queues 342.
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US-8380915-A1
The solid-state storage controller 104 includes control and status registers 340 and corresponding control queues 342. The control and status registers 340 and control queues 342 facilitate control and sequencing commands and subcommands associated with data processed in the write and read data pipelines 106, 108. For example, a data segment in the packetizer 302 may have one or more corresponding control commands or instructions in a control queue 342 associated with the ECC encoder 304. As the data segment is packetized, some of the instructions or commands may be executed within the packetizer 302. Other commands or instructions may be passed to the next control queue 342 through the control and status registers 340 as the newly formed data packet created from the data segment is passed to the next stage.
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US-8380915-A1
1. Field
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US-8380915-A1
The subject matter disclosed herein relates to solid-state storage media and more particularly relates to configuration parameters for solid-state storage media.
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US-8380915-A1
2. Description of the Related Art
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US-8380915-A1
Many solid-state storage devices distinguish between different binary values that a storage cell may store based on a read voltage level of the storage cell, based on a resistivity of the storage cell, or based on another configuration parameter of the storage cell. Solid-state storage devices may use one or more read voltage thresholds, resistivity thresholds, or the like to separate discrete values that may be stored in a storage cell.
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US-8380915-A1
Thresholds or other configuration parameters for a storage cell, however, can shift over time. For example, storage cell damage, storage cell leakage, temperature, and other disturbances to storage cells can alter thresholds for storage cells, making different configuration parameters more optimal for the storage cells. The rate of leakage and other disturbances can also increase with age as storage cells are used over time. If the read voltage level or other configuration parameter of a storage cell shifts past a threshold for the storage cell, a data error occurs, as the value of the data read from the storage cell is different than the value of the data written to the storage cell.
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US-8380915-A1
From the foregoing discussion, it should be apparent that a need exists for an apparatus, system, and method that improve the utility of solid-state storage media. Beneficially, such an apparatus, system, and method would improve the utility of solid-state storage media by determining one or more configuration parameters for the solid-state storage media to optimize the configuration parameters.
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US-8380915-A1
A method of the present invention is presented to manage solid-state storage media. In one embodiment, the method includes referencing one or more storage media characteristics for a set of storage cells of solid-state storage media. The method, in a further embodiment, includes determining a configuration parameter for the set of storage cells based on the one or more storage media characteristics. In another embodiment, the method includes configuring the set of storage cells to use the determined configuration parameter.
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US-8380915-A1
An apparatus to manage solid-state storage media is provided with a plurality of modules configured to functionally execute the necessary steps of improving the utility of solid-state storage media. These modules in the described embodiments include a media characteristic module, a configuration parameter module, a storage cell configuration module, a characteristic update module, and a configuration update module.
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US-8380915-A1
In one embodiment, the media characteristic module references one or more storage media characteristics for a set of storage cells of solid-state storage media. The configuration parameter module, in one embodiment, determines a configuration parameter for the set of storage cells based on the one or more storage media characteristics. In another embodiment, the storage cell configuration module configures the set of storage cells to use the determined configuration parameter.
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