16869424
Paragraph Number239
6479
| Application | Calibrating non-volatile memory read thresholds | ||
|---|---|---|---|
| Matter Number | US10998041B1 | Reference Case 1 | US10998041B1 |
| Created | 12/22/21, 12:00 AM | Modified | 12/22/21, 12:00 AM |
Application Number
Content
In one embodiment, the read scan circuit 1312 may determine a first read level for reading data programmed to a first set of memory cells of the storage block 1316. The first set of memory cells may be associated with a first memory state.
Notes
Added by DJM 12 2021