Paragraph 234
Paragraph 234
Application
Calibrating non-volatile memory read thresholds
Matter Number
US10998041B1
Paragraph Number
234
Application Number
16869424
Reference Case 1
US10998041B1
Reference Case 2
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Created
12/22/21, 12:00 AM
Modified
12/22/21, 12:00 AM
Id
6,474
Content
The read scan circuit 1312 may read data from a storage block to determine appropriate read levels. For example, in one embodiment, the health manager 1310 may implement a BES read scan operation using the read scan circuit 1312, calibration circuit 1314, and error correction code decoder 1308. The read scan circuit 1312 may coordinate with the error correction code decoder 1308 to determine a bit error rate, or an estimated or proxy bit error rate, for each read of a storage block, this bit error rate may be called a read bit error rate. In one embodiment, the error correction code decoder 1308 determines the bit error rate without doing any error correction or detection. In another embodiment, the error correction code decoder 1308 determines the bit error rate after attempting or completing error correction or detection.
Notes
Added by DJM 12 2021