16869424
Paragraph Number234
6474
| Application | Calibrating non-volatile memory read thresholds | ||
|---|---|---|---|
| Matter Number | US10998041B1 | Reference Case 1 | US10998041B1 |
| Created | 12/22/21, 12:00 AM | Modified | 12/22/21, 12:00 AM |
The read scan circuit 1312 may read data from a storage block to determine appropriate read levels. For example, in one embodiment, the health manager 1310 may implement a BES read scan operation using the read scan circuit 1312, calibration circuit 1314, and error correction code decoder 1308. The read scan circuit 1312 may coordinate with the error correction code decoder 1308 to determine a bit error rate, or an estimated or proxy bit error rate, for each read of a storage block, this bit error rate may be called a read bit error rate. In one embodiment, the error correction code decoder 1308 determines the bit error rate without doing any error correction or detection. In another embodiment, the error correction code decoder 1308 determines the bit error rate after attempting or completing error correction or detection.
Added by DJM 12 2021