Paragraph 224
Paragraph 224
Application
Calibrating non-volatile memory read thresholds
Matter Number
US10998041B1
Paragraph Number
224
Application Number
16869424
Reference Case 1
US10998041B1
Reference Case 2
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Created
12/22/21, 12:00 AM
Modified
12/22/21, 12:00 AM
Id
6,464
Content
In certain embodiments, a read scan circuit 1204 may apply a correlation factor directly to a current read level for a second memory state and thereby determine the second read level without testing or checking candidate read levels for a second read level window. For example, the read scan circuit 1204 may multiple the current read level by the correlation factor that represents a correlation between the first memory state and the second memory state. In such an embodiment, determining the second read level may be more efficient and may be made possible where the correlation between two memory states is strong enough to skip testing candidate read levels for a second read level window 1104.
Notes
Added by DJM 12 2021