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Application Calibrating non-volatile memory read thresholds
Matter Number US10998041B1 Reference Case 1 US10998041B1
Created 12/22/21, 12:00 AM Modified 12/22/21, 12:00 AM
Application Number

16869424

Paragraph Number

171

Content

In addition, a BES read scan operation may test candidate read levels in a predefined order. For example, when checking for read level D 412, the predefined order of candidate read levels may be #10, then #13, then #14, then #8, then #9. This predefined order may be determined by a manufacturer based on a series of tests and research and development to understand which candidate read levels are most likely to result in the lowest bit error rate after the fewest number of iterations within the BES read scan operation.

Notes

Added by DJM 12 2021