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Paragraph Number171
6411
| Application | Calibrating non-volatile memory read thresholds | ||
|---|---|---|---|
| Matter Number | US10998041B1 | Reference Case 1 | US10998041B1 |
| Created | 12/22/21, 12:00 AM | Modified | 12/22/21, 12:00 AM |
Application Number
Content
In addition, a BES read scan operation may test candidate read levels in a predefined order. For example, when checking for read level D 412, the predefined order of candidate read levels may be #10, then #13, then #14, then #8, then #9. This predefined order may be determined by a manufacturer based on a series of tests and research and development to understand which candidate read levels are most likely to result in the lowest bit error rate after the fewest number of iterations within the BES read scan operation.
Notes
Added by DJM 12 2021