Paragraph 143
Paragraph 143
Application
Calibrating non-volatile memory read thresholds
Matter Number
US10998041B1
Paragraph Number
143
Application Number
16869424
Reference Case 1
US10998041B1
Reference Case 2
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Created
12/22/21, 12:00 AM
Modified
12/22/21, 12:00 AM
Id
6,383
Content
"Read scan operation" refers to a maintenance operation performed to identify and mitigate or avoid or counter errors in the data or storage cells and/or other components of a non-volatile storage device. A read scan operation may be referred to, interchangeably, as a "read scan" or "read scan operation." In one embodiment, a read scan operation involves reading data from, or sensing a determinable physical characteristic, or a memory state of storage cells in a storage block. Next, the read scan operation checks the memory states of the storage cells for any errors, corrects as many errors as possible, and determines a bit error rate. Then, the read scan operation determines if the bit error rate satisfies a threshold such as a read bit error rate threshold.
Notes
Added by DJM 12 2021