Paragraph 126
Paragraph 126
Application
Calibrating non-volatile memory read thresholds
Matter Number
US10998041B1
Paragraph Number
126
Application Number
16869424
Reference Case 1
US10998041B1
Reference Case 2
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Created
12/22/21, 12:00 AM
Modified
12/22/21, 12:00 AM
Id
6,366
Content
"Read level" refers to a voltage level configured to test, check, read, or sense, which memory cells conduct at the voltage level. In certain embodiments, the memory cells may comprise transistors and the read level, or read voltage, is a voltage level at, or above a threshold voltage for the memory cells which causes the memory cell to conduct a current, to activate.
Notes
Added by DJM 12 2021