Paragraph 32
Paragraph 32
Application
Calibrating non-volatile memory read thresholds
Matter Number
US10998041B1
Paragraph Number
32
Application Number
16869424
Reference Case 1
US10998041B1
Reference Case 2
—
Created
12/22/21, 12:00 AM
Modified
12/22/21, 12:00 AM
Id
6,272
Content
"Memory die" refers to a small piece of semiconducting material on which a given functional circuit is fabricated. Typically, integrated circuits are produced in large batches on a single wafer of electronic-grade silicon (EGS) or other semiconductor (such as GaAs) through processes such as photolithography. The wafer is cut (diced) into many pieces, each containing one copy of the circuit. Each of these pieces is called a die or memory die. (Search `die (integrated circuit)` on Wikipedia.com Oct. 9, 2019. Accessed Nov. 18, 2019.)
Notes
Added by DJM 12 2021