Paragraph 274

Paragraph 274

Application: US-8380915-A1

Matter Number
Paragraph Number 274
Application Number 13189402
Reference Case 1
Reference Case 2
Created 3/12/21, 12:00 AM
Modified 3/12/21, 12:00 AM
Id 2,847
Content
Because, in the depicted embodiment, the ECC checkbits for the ECC chunk 616 are distributed across several storage elements 606a-n and channels 604a-n, when a data error occurs due to a read voltage shift in one or more of the storage elements 606a-n, the ECC module 412 may not be able to determine which storage elements 606 have an error that is correctable by adjusting the read voltage threshold. In one embodiment, the distribution module 414 determines which storage elements 606 or channels 604 have data with a read bias that is outside an expected distribution of the known bias, and the configuration module 352 adjusts the read voltage thresholds of the storage elements 606 determined by the distribution module 414.
Notes Added by DJM 3 2021