Paragraph 225
Paragraph 225
Matter Number
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Paragraph Number
225
Application Number
13189402
Reference Case 1
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Reference Case 2
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Created
3/12/21, 12:00 AM
Modified
3/12/21, 12:00 AM
Id
2,798
Content
In a further embodiment, the ECC module 412 uses ECC checkbits to determine in which die, chip, channel, storage element, PEB, or other grouping of storage cells of the solid-state storage media 110 an uncorrectable error has occurred. The ECC module 412, in one embodiment, verifies data sets of each grouping of storage cells using ECC checkbits to determine which particular grouping from a set of groupings of storage cells have uncorrectable errors. The configuration module 352, in one embodiment, adjusts one or more read voltage thresholds in the particular groupings of storage cells with an uncorrectable error.
Notes
Added by DJM 3 2021