Paragraph 193
Paragraph 193
Matter Number
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Paragraph Number
193
Application Number
13189402
Reference Case 1
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Reference Case 2
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Created
3/12/21, 12:00 AM
Modified
3/12/21, 12:00 AM
Id
2,766
Content
The data error may occur due to a shift in a voltage level retained in one or more storage cells of the solid-state storage media 110. This retained voltage level of a storage cell is referred to herein as a read voltage level. The read error module 420, in one embodiment, reads the data set as part of a testing operation. The configuration module 352 may conduct the testing operation in response to the data error, in response to a scheduled maintenance operation, in response to an initial calibration operation, or the like. The data set used by the read error module 420 may come from a client-requested packet, or may be sample data read as part of the testing operation.
Notes
Added by DJM 3 2021