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The configuration parameter module 504 may base a configuration parameter on one or more storage media characteristics by entering the one or more storage media characteristics into an equation, into a lookup table (“LUT”), into a matrix, or the like; by performing a predefined transform or operation on the one or more storage media characteristics; or by otherwise referencing and/or manipulating the one or more storage media characteristics to determine the configuration parameter. A configuration parameter equation, LUT, matrix, or the like may be based on empirical data, such as test data, historical data, and the like. A design engineer or the like, in one embodiment, may test sets of storage cells with various storage media characteristics, such as solid-state storage media from various manufacturers or the like, and determine optimal configuration parameters for storage cells with the various storage media characteristics. For example, an equation, LUT, matrix, or the like may indicate that solid-state storage media 110 from manufacturer X tends to have Y amount of natural drift in cell values after 1,000 program/erase cycles such that a read threshold can be increased by Z volts to compensate, or the like.

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<w:p><w:pPr><w:pStyle w:val="TPSBody100"/></w:pPr><w:r><w:t xml:space="preserve">The configuration parameter module </w:t></w:r><w:r><w:t>504</w:t></w:r><w:r><w:t xml:space="preserve"> may base a configuration parameter on one or more storage media characteristics by entering the one or more storage media characteristics into an equation, into a lookup table (“LUT”), into a matrix, or the like; by performing a predefined transform or operation on the one or more storage media characteristics; or by otherwise referencing and/or manipulating the one or more storage media characteristics to determine the configuration parameter. A configuration parameter equation, LUT, matrix, or the like may be based on empirical data, such as test data, historical data, and the like. A design engineer or the like, in one embodiment, may test sets of storage cells with various storage media characteristics, such as solid-state storage media from various manufacturers or the like, and determine optimal configuration parameters for storage cells with the various storage media characteristics. For example, an equation, LUT, matrix, or the like may indicate that solid-state storage media </w:t></w:r><w:r><w:t>110</w:t></w:r><w:r><w:t xml:space="preserve"> from manufacturer X tends to have Y amount of natural drift in cell values after 1,000 program/erase cycles such that a read threshold can be increased by Z volts to compensate, or the like.</w:t></w:r></w:p>