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The device factor module 354, in one embodiment, provides one or more statistics for the solid-state storage device 102 to the configuration module 352. The configuration module 352, in certain embodiments, may make a configuration parameter adjustment 358 based on the one or more statistics, may supplement information from the inverse bias module 332 and/or the ECC decoder 322 with the one or more statistics, or the like. The one or more statistics for the solid-state storage device 102, in one embodiment, include statistics that may affect read voltages of storage cells of the solid-state storage device 102. For example, in certain embodiments, the one or more statistics may include a temperature for the solid-state storage device 102, an error rate for the solid-state storage device 102 (such as an uncorrectable bit error rate “UBER” or the like), an erase cycle count for the solid-state storage device 102, a storage request latency for the solid-state storage device 102 (such as an average, maximum, or other storage request execution latency), an age of the solid-state storage device 102, and/or other statistics or characteristics.

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<w:p><w:pPr><w:pStyle w:val="TPSBody100"/></w:pPr><w:r><w:t xml:space="preserve">The device factor module </w:t></w:r><w:r><w:t>354</w:t></w:r><w:r><w:t xml:space="preserve">, in one embodiment, provides one or more statistics for the solid-state storage device </w:t></w:r><w:r><w:t>102</w:t></w:r><w:r><w:t xml:space="preserve"> to the configuration module </w:t></w:r><w:r><w:t>352</w:t></w:r><w:r><w:t xml:space="preserve">. The configuration module </w:t></w:r><w:r><w:t>352</w:t></w:r><w:r><w:t xml:space="preserve">, in certain embodiments, may make a configuration parameter adjustment </w:t></w:r><w:r><w:t>358</w:t></w:r><w:r><w:t xml:space="preserve"> based on the one or more statistics, may supplement information from the inverse bias module </w:t></w:r><w:r><w:t>332</w:t></w:r><w:r><w:t xml:space="preserve"> and/or the ECC decoder </w:t></w:r><w:r><w:t>322</w:t></w:r><w:r><w:t xml:space="preserve"> with the one or more statistics, or the like. The one or more statistics for the solid-state storage device </w:t></w:r><w:r><w:t>102</w:t></w:r><w:r><w:t xml:space="preserve">, in one embodiment, include statistics that may affect read voltages of storage cells of the solid-state storage device </w:t></w:r><w:r><w:t>102</w:t></w:r><w:r><w:t xml:space="preserve">. For example, in certain embodiments, the one or more statistics may include a temperature for the solid-state storage device </w:t></w:r><w:r><w:t>102</w:t></w:r><w:r><w:t xml:space="preserve">, an error rate for the solid-state storage device </w:t></w:r><w:r><w:t>102</w:t></w:r><w:r><w:t xml:space="preserve"> (such as an uncorrectable bit error rate “UBER” or the like), an erase cycle count for the solid-state storage device </w:t></w:r><w:r><w:t>102</w:t></w:r><w:r><w:t xml:space="preserve">, a storage request latency for the solid-state storage device </w:t></w:r><w:r><w:t>102</w:t></w:r><w:r><w:t xml:space="preserve"> (such as an average, maximum, or other storage request execution latency), an age of the solid-state storage device </w:t></w:r><w:r><w:t>102</w:t></w:r><w:r><w:t>, and/or other statistics or characteristics.</w:t></w:r></w:p>