{
    "matter": "Placeholder App",
    "document_type": "Patent terminology definitions",
    "definitions": [
        {
            "term": "Asymmetric storage media",
            "definition": "a storage media having different latencies for different storage operations. Many types of solid-state storage media (e.g., memory dies) are asymmetric; for example, a read operation may be much faster than a write/program operation, and a write/program operation may be much faster than an erase operation (e.g., reading the storage media may be hundreds of times faster than erasing, and tens of times faster than programming the storage media)."
        },
        {
            "term": "Attribute (long)",
            "definition": "As used herein, \"attribute\" refers to any property, trait, aspect, quality, data value, setting, or feature of an object or thing. In embodiments of the claimed solution, attribute refers to properties of an object detector and may include, but is not limited to, an accuracy level for the object detector, a latency for the object detector between receiving input(s) and providing an output (e.g., an inference result, an object detection prediction), a measure of an amount of memory resources the object detector uses, a measure of a resolution level for an image or frame provided as input to the object detector, a measure of an amount of processor resources the object detector uses, a measure of the number of computations the object detector performs per unit of time, such as seconds, and the like. \r\n\r\nWhere the object detector comprises a neural network, the attribute(s) of the object detector may include, but are not limited to, a type of neural network, a number of layers of the neural network, a number of nodes of the neural network, a number and/or type of interconnection between nodes of the neural network, a number of parameters used in the neural network, a number of floating point operations per second (FLOPS) for the neural network, and the like.\r\n\r\nWhere the object detector comprises a neural network, object detectors may be compared based on attributes for each object detector. In certain embodiments, object detectors in the form of neural networks may be compared, at a high level, using a rough comparison reference to size or weight. Generally, these size or weight comparisons of neural networks may be used to compare the neural networks based on a collection of attributes that relate to tradeoffs between one or more performance metrics and one or more operational constraints.\r\n\r\nFor example, an object detector/neural network may be described as heavy, heavyweight, large, thick, or fat and have the attributes of having a relatively high number of nodes, high number of layers, high FLOPS, high memory usage, and/or high computational latency, in exchange for higher accuracy of object detection. \r\n\r\nIn contrast and by comparison, another object detector/neural network may be described as light, lightweight, small, thin, or lean and have the attributes of having a relatively small/low number of nodes, small/low number of layers, small/low FLOPS, small/low memory usage, and/or small/low computational latency, in exchange for lower accuracy of object detection.\r\n\r\nWhere the object detector comprises a neural network, and a convolutional neural network in particular, the attribute(s) may also be referred to as hyperparameters and may include aspects such as a number of total layers to use in the neural network, a number of convolution layers, filter sizes, values for strides at each layer, and/or the like."
        },
        {
            "term": "bad word line",
            "definition": "\"Bad word line\" refers to a word line that is not available for use to read or write data to storages cells, memory cells of the word line. A bad word line may refer to a single physical word line (a physical page) or a plurality of physical word lines (physical page), that together form a logical word line, logical page. Thus, depending on the context bad word line may refer to a bad physical page and/or bad logical page.There are a number of reasons, causes, or circumstances that may result in a word line being marked, tracked, or otherwise identified as a bad word line. For example, a word line may have an electrical short between a structure of the word line and another structure in a non-volatile memory array. In another example, the memory cells of a word line may be worn to the point that the word line can no longer be reliably used to store and read data. Said another way, a bad word line may have too many errors to be useable, or may have been retired from further use, or may have failed. Alternatively, or in addition, memory cells of a word line may have such poor performance that the word line can no longer be used and still need operating performance requirements or expectations.Bad word lines may be designated as such when a non-volatile memory array is manufactured and/or as word lines become bad word lines as the word lines are used. In certain embodiments,"
        },
        {
            "term": "Baseline temperature code",
            "definition": "a temperature code that is trimmed to serve as a point of reference in calculating a slope error. In one embodiment, a baseline temperature code is determined by adjusting, trimming, and/or configuring a temperature sensor such that a measured temperature code represents a temperature that matches an actual temperature at a point in time, where the trimming and adjustments remove error from the measured temperature code. After a trimming or adjustment operation, the trimmed measured temperature code comprises the baseline temperature code."
        },
        {
            "term": "circuit",
            "definition": "A circuit, as used herein, comprises a set of one or more electrical and/or electronic components providing one or more pathways for electrical current. In certain embodiments, a circuit may include a return pathway for electrical current, so that the circuit is a closed loop. In another embodiment, however, a set of components that does not include a return pathway for electrical current may be referred to as a circuit (e.g., an open loop). For example, an integrated circuit may be referred to as a circuit regardless of whether the integrated circuit is coupled to ground (as a return pathway for electrical current) or not. In various embodiments, a circuit may include a portion of an integrated circuit, an integrated circuit, a set of integrated circuits, a set of non-integrated electrical and/or electrical components with or without integrated circuit devices, or the like. In one embodiment, a circuit may include custom VLSI circuits, gate arrays, logic circuits, or other integrated circuits; off-the-shelf semiconductors such as logic chips, transistors, or other discrete devices; and/or other mechanical or electrical devices. A circuit may also be implemented as a synthesized circuit in a programmable hardware device such as field programmable gate array, programmable array logic, programmable logic device, or the like (e.g., as firmware, a netlist, or the like). A circuit may comprise one or more silicon integrated circuit devices (e.g., chips, die, die planes, packages) or other discrete electrical devices, in electrical communication with one or more other components through electrical lines of a printed circuit board (PCB) or the like. Each of the modules described herein, in certain embodiments, may be embodied by or implemented as a circuit."
        },
        {
            "term": "circuit",
            "definition": "\"Circuit\" refers to a set of one or more electrical and/or electronic components providing one or more pathways for electrical current. In certain embodiments, a circuit may include a return pathway for electrical current, so that the circuit is a closed loop. In another embodiment, however, a set of components that does not include a return pathway for electrical current may be referred to as a circuit (e.g., an open loop). For example, an integrated circuit may be referred to as a circuit regardless of whether the integrated circuit is coupled to ground (as a return pathway for electrical current) or not. In various embodiments, a circuit may include a portion of an integrated circuit, an integrated circuit, a set of integrated circuits, a set of non-integrated electrical and/or electrical components with or without integrated circuit devices, or the like.In one embodiment, a circuit may include custom VLSI circuits, gate arrays, logic circuits, or other integrated circuits; off-the-shelf semiconductors such as logic chips, transistors, or other discrete devices; and/or other mechanical or electrical devices.A circuit may also be implemented as a synthesized circuit in a programmable hardware device such as field programmable gate array, programmable array logic, programmable logic device, or the like (e.g., as firmware, a netlist, or the like). A circuit may comprise one or more silicon integrated circuit devices (e.g., chips, die, die planes, packages) or other discrete electrical devices, in electrical communication with one or more other components through electrical lines of a printed circuit board (PCB) or the like. Each of the modules described herein, in certain embodiments, may be embodied by or implemented as a circuit."
        },
        {
            "term": "circuitry",
            "definition": "\"Circuitry\" refers to electrical circuitry having at least one discrete electrical circuit, electrical circuitry having at least one integrated circuit, electrical circuitry having at least one application specific integrated circuit, circuitry forming a general purpose computing device configured by a computer program (e.g., a general purpose computer configured by a computer program which at least partially carries out processes or devices described herein, or a microprocessor configured by a computer program which at least partially carries out processes or devices described herein), circuitry forming a memory device (e.g., forms of random-access memory), or circuitry forming a communications device (e.g., a modem, communications switch, or optical-electrical equipment)."
        },
        {
            "term": "Clock",
            "definition": "any hardware, software, firmware, circuit, electronic component, module, logic, device, or apparatus configured, programmed, designed, arranged, or engineered to supply a clock signal for two or more circuits or electronic components."
        },
        {
            "term": "Clock cycle",
            "definition": "a time between when an oscillator that generates a clock signal changes from providing a high clock signal to a low clock signal or vice versa. A clock cycle is measured between to common points on a curve representing the clock cycle, e.g., the rising edge, or falling edge, or the like."
        },
        {
            "term": "Clock signal",
            "definition": "a control signal, used with synchronous digital circuits, configured to oscillate between a high state and a low state at a particular rate or frequency, measured in clock cycles, for a communication interface. Common clock signals operate such that the signal forms a square wave with a 50% duty cycle. Electronic components rely on a clock signal operating at a constant, fixed frequency. Circuits using a clock signal for synchronization may become active at either the rising edge, falling edge, or, in the case of double data rate, both in the rising and in the falling edges of the clock cycle. (Search 'clock signal' on Wikipedia.com Nov. 11, 2019. Modified. Accessed Feb. 20, 2020.)"
        },
        {
            "term": "combined XOR parity data",
            "definition": "\"Combined XOR parity data\" refers to an XOR parity data calculation that combines XOR parity data from two sets of data. In one example, data in one storage block of nonvolatile memory is combined using, for example, a bitwise exclusive or (e.g., XOR) operation, with data in a second storage block. The output of the bitwise XOR operation is combined XOR parity data. As needed, the output of the bitwise XOR operation can be combined with another set of data from a storage block to create a new set of combined XOR parity data. Based on a number of storage blocks for which XOR parity data is to be combined into combined XOR parity data, a process of successive bitwise XOR operations (termed accumulating XOR parity data) may be performed on the data of each storage block in order to generate combined XOR parity data.Thus, in one embodiment, XOR parity data from one open storage block of nonvolatile memory may be combined with XOR parity data from another, or each of a plurality of storage blocks, of nonvolatile memory to generate combined XOR parity data."
        },
        {
            "term": "Control signal",
            "definition": "an electrical signal (wired or wireless) sent from one device, component, manager, or controller to another device, component, manager, or controller configured to act in response to the control signal."
        },
        {
            "term": "Control signal value",
            "definition": "\"Control signal value\" refers to a value, indicator, flag, setting or the like that identifies whether a control signal is to have a high, one, or active voltage bias, or a low, zero, or inactive voltage bias. Where control signals are analog electronic signals, a control signal value may comprise a voltage level indicative of a one or a voltage level indicative of a zero."
        },
        {
            "term": "correlation data structure",
            "definition": "\"Correlation data structure\" refers to a data structure configured to store one or more correlation factors and an index for identifying the correlation factor for a particular correlation between two items or things. In one embodiment, a correlation data structure may be a table, an array, a list, a linked list, portion of a memory, a database, or the like. An index for the correlation data structure for correlation factors between memory states may comprise a row identifier for a memory state of correlation data structure table and a correlated memory state may comprise a column of the correlation data structure table."
        },
        {
            "term": "current control circuit",
            "definition": "\"Current control circuit\" refers to a circuit, sub-circuit, circuitry, electronic component, hardware, software, firmware, module, logic, device, or apparatus configured, programmed, designed, arranged, or engineered to supply a one or more currents from one or more current sources. In one embodiment, one or more of the one or more current sources controlled by the current control circuit may comprise variable/configurable current sources. In particular, in one embodiment, another controller, such as a storage controller, may define a current level for each of the one or more variable current sources by way of the current control circuit."
        },
        {
            "term": "current mirror circuit",
            "definition": "\"Current mirror circuit\" refers to a circuit, sub-circuit, circuitry, electronic component, hardware, software, firmware, module, logic, device, or apparatus configured, programmed, designed, arranged, or engineered to mirror/copy a current through one active device by controlling the current in another active device of a circuit, keeping the output current constant regardless of loading. (search \"current mirror\" on Wikipedia.com March 6, 2020. Modified. Accessed May 1, 2020.)"
        },
        {
            "term": "data bus",
            "definition": "\"Data bus\" refers to a communication bus used to exchange one or more of data bits between two electronic circuits, components, chips, die, and/or systems.  A data bus may include one or more signal/control lines. A sender, such as a controller, may send data signals over one or more control lines of the data bus in parallel (operating as a parallel bus) or in series (operating as a serial bus). A data bus may include the hardware, control line(s), software, firmware, logic, and/or the communication protocol used to operate the data bus.Examples data buses may include 8-bit buses having 8 control lines, 16-bit buses having 16 control lines, 32-bit buses having 32 control lines, 64-bit buses having 64 control lines, and the like. Control lines may carry exclusively communication data, exclusively address data, exclusively control data, or any combination of these types of data.In one embodiment, a single data bus may be shared by a plurality of components, such as memory die. When multiple chips or memory die share a data bus, that data may be accessed or transferred by a single memory die or by all the memory die in parallel based on signals on a chip enable control line.A data bus may operate, and be configured, according to an industry standard or based on a proprietary protocol and design. Multiple control line of a data bus may be used in parallel and may latch data into latches of a destination component according to a clocking signal, data strobe signal (\"DQS\"), or clock, such as strobe signal. In certain embodiments, a control bus and a data bus together may form a communication bus between a sender and a receiver."
        },
        {
            "term": "data section",
            "definition": "\"Data section\" refers to one part of a storage block. A data section stores data blocks within the storage block.  The data block may include XOR parity data in addition to any XOR parity data stored in a parity section associated with the data section. For example, the data block may store one or more codewords that include data and error correction code data (another form of XOR parity data) that protects the data of the codeword.The data section may be organized in a variety of ways in different embodiments. In certain embodiments, the data section includes a plurality of logical pages each made up of physical pages that span planes and memory die of a non-volatile memory array."
        },
        {
            "term": "differential data",
            "definition": "\"Differential data\" refers to data used to convert an invalid parity section into a valid parity section. Based on the actions to be done to convert a fragmented source storage block into a whole source storage block, the differential data may include a number of different types of data.  For example, in one embodiment, the differential data may include invalid data from a fragmented source storage block, an invalid parity section from the same fragmented source storage block, a valid parity section, and fill data that will be stored in a whole source storage block resulting from the fragmented source storage block."
        },
        {
            "term": "differentiator",
            "definition": "\"Differentiator\" refers to any hardware, software, firmware, circuit, component, module, logic, device, or apparatus configured, programmed, designed, arranged, or engineered to manage differential data and define a whole source storage block that includes fill data and a valid parity section associated with a fragmented source storage block."
        },
        {
            "term": "driver circuit",
            "definition": "\"Driver circuit\" refers to a circuit, sub-circuit, circuitry, electronic component, hardware, software, firmware, module, logic, device, or apparatus configured, programmed, designed, arranged, or engineered to supply a voltage, either in analog or digital wave form, to another circuit, sub-circuit, electronic component, logic, device, or apparatus."
        },
        {
            "term": "fill data",
            "definition": "\"Fill data\" refers to one or more data blocks that comprise valid data and are used to replace invalid data within a storage block, such as a fragmented source storage block. Relocating fill data may include updating a physical block address associated with the logical block address for the data block that includes the fill data."
        },
        {
            "term": "intellectual property",
            "definition": "“Intellectual Property” means all of the following, whether protected, created or arising under the Laws of the United States or any foreign jurisdiction: (i) all inventions (whether patentable or unpatentable and whether or not reduced to practice), patent disclosures, industrial designs, all improvements thereto, and all United States and foreign patents, patent applications (including all patents issuing thereon), statutory invention registrations and invention disclosures, together with all continuation applications of all types, including reissuances, restorations, divisions, continuations, continuations-in-part, revisions, extensions and re-examinations thereof, and all rights therein provided by international treaties or conventions; (ii) all United States and non U.S. copyrightable works (including copyrights in Software), design rights, database rights, all copyrights and applications, registrations and renewals in connection therewith, whether registered or unregistered; (iii) trade secrets, know-how and information that is proprietary and confidential; and (iv) all mask works (as defined in 17 U.S. C. §901) and all applications, registrations and renewals in connection therewith; all United States and foreign trademarks, service marks, trade dress, logos, trade names, Internet domain names, moral rights, designs, slogans and corporate names and general intangibles of like nature, whether registered or unregistered, together with all translations, adaptations, derivations and combinations thereof and other identifiers of source and including all goodwill associated therewith and all rights therein provided by international treaties or conventions, common law rights, applications, registrations, pending registrations, applications to register, reissues, extensions of the foregoing and renewals in connection therewith."
        },
        {
            "term": "invalid data",
            "definition": "\"Invalid data\" refers to data stored in a storage block that a host has affirmatively deleted or has indicated is no longer needed or can be deleted because the data has been superseded by a new or changed version of the data. In non-volatile storage media comprising storage cells that are write once storage media, if data is modified by a host, the modified version of the data causes the original data stored in the write once storage media to become invalid data, the data is invalidated because it no longer represents a current version of the data."
        },
        {
            "term": "latency data",
            "definition": "\"Latency data\" refers to data that identifies or may be used to determine a latency for an associated activity, event, or operation, such as a storage operation."
        },
        {
            "term": "leakage detection circuit",
            "definition": "\"Leakage detection circuit\" refers to a circuit, sub-circuit, circuitry, electronic component, hardware, software, firmware, module, logic, device, or apparatus configured, programmed, designed, arranged, or engineered to sense/detect/determine current leakage current within, or from, one or more target control lines that are tested or checked for leakage current.  In one embodiment, the target control lines may comprise one or more of word lines, bit lines, NAND strings, memory cells, and the like."
        },
        {
            "term": "Lowest temperature",
            "definition": "a minimum temperature within a temperature range. In one embodiment, a lowest temperature is a minimum temperature represented by a whole number."
        },
        {
            "term": "metadata",
            "definition": "As used herein, \"metadata\" refers to data that describes, represents or is associated with other data. Examples of metadata includes, but is not limited to, error correction code data, parity data, parity bits, redundancy data, parameter settings, and the like.\r\nIn one embodiment, metadata refers to system data usable to facilitate operation of non-volatile storage device. Metadata stands in contrast to, for example, data produced by an application (i.e., application data) or forms of data that would be considered by an operating system as user data. For example, a zone or a logical erase block may include metadata specifying, without limitation, usage statistics (e.g., the number of program erase cycles performed on that zone or logical erase block, health statistics (e.g., a value indicative of how often corrupted data has been read from that zone or logical erase block), security or access control parameters, sequence information (e.g., a sequence indicator), a persistent metadata flag (e.g., indicating inclusion in an atomic storage operation), a transaction identifier, or the like."
        },
        {
            "term": "non-volatile storage media",
            "definition": "\"Non-volatile storage media\" refers to any hardware, device, component, element, or circuit configured to maintain an alterable physical characteristic (deleted) used to represent a binary value of zero or one after a primary power source is removed. Non-volatile storage media may be used interchangeably herein with the term non-volatile memory media."
        },
        {
            "term": "Operating temperature",
            "definition": "a temperature at which a device, apparatus, and/or component is currently operating."
        },
        {
            "term": "parity section (parity bin version)",
            "definition": "\"Parity section\" refers to one part of a storage block. A parity section stores XOR parity data for a set of parity bins that enable a data recovery process for one, or both of, physical pages within a logical page of the storage block and one or more logical pages of the storage block.In one embodiment, a parity section includes one or more parity rows. In a storage block that stores a single bit per memory cell, the storage block may include a single parity row. In a storage block that stores a multiple bits per memory cell (e.g., MLC, TLC, QLC, PLC), the storage block may include a parity row associated with each level of bits stored within the memory cells.  For example, three parity rows for storage blocks storing three bits per cells. Four parity rows for storage blocks storing four bits per cells."
        },
        {
            "term": "power supply",
            "definition": "\"Power Supply refers to a source of electrical energy for one or more electrical circuits connected to the power supply."
        },
        {
            "term": "printed circuit board",
            "definition": "\"Printed circuit board\" or “PCB” refers to a structure that mechanically supports and electrically connects electrical or electronic components using conductive tracks, traces, pads, and other features etched from one or more sheet layers of copper laminated onto and/or between sheet layers of a non-conductive substrate. Components may be soldered onto the PCB to both electrically connect and mechanically fasten them to it. PCBs can be single-sided (one copper layer), double-sided (two copper layers on both sides of one substrate layer), or multi-layer (outer and inner layers of copper, alternating with layers of substrate). Multi-layer PCBs allow for higher component density, because circuit traces on the inner layers free up surface space between components. Multilayer PCBs may include two, three, four, or more copper planes (layers for traces). (Search \"printed circuit board\" on Wikipedia.com May 22, 2020. Modified. Accessed June 4, 2020.)"
        },
        {
            "term": "Programmed temperature",
            "definition": "the die temperature of the memory cells and/or memory die at the time that data is programmed (i.e., stored) to the memory cells."
        },
        {
            "term": "pulse",
            "definition": "\"Pulse\" refers to an analog signal that rises quickly and then falls within a relatively short duration. In certain embodiments, a pulse may comprise a short voltage level increase that rises quickly to a peak level and then quickly falls."
        },
        {
            "term": "register",
            "definition": "“Register” refers to a temporary storage location used to store an address, or a data value, used in a computing operation by a processor, circuit, or logic. Certain registers may be named based on a type of data the register normally stores such as an address register that stores addresses or a data register that stores data or an operand register that stores values used in a firmware instruction. A register may be implemented with logic gates, flip-flops, SRAM, or the like."
        },
        {
            "term": "scratch memory",
            "definition": "\"Scratch memory\" refers to a section of memory that temporarily stores data for use in subsequent operations."
        },
        {
            "term": "sensor data",
            "definition": "\"Sensor data\" refers to any data or information registered by one or more sensors.  Examples of sensor data include an amount of current passing through the sensor, an amount of voltage across the sensor, an amount of electrical resistance through the sensor, an amount of strain experienced by the sensor, an acceleration vector, a deceleration vector, an orientation, an orientation angle, a direction, and the like."
        },
        {
            "term": "signal",
            "definition": "\"Signal\" refers to an electrical signal (wired or wireless) sent from one component, circuit, driver, device, manager, or controller to another component, circuit, sub-circuit, driver, device, manager, or controller.  In one embodiment, the signal comprises an analog signal. In another embodiment, the signal comprises a digital signal."
        },
        {
            "term": "Storage media",
            "definition": "any physical media organized and configured to store one or more bits of data. In one embodiment, storage media refers to physical storage cells and/or memory cells used in volatile memory media. In another embodiment, storage media refers to physical storage cells and/or memory cells used in non-volatile memory media."
        },
        {
            "term": "storage media characteristic",
            "definition": "A storage media characteristic is a statistic, heuristic, or other descriptor associated with an attribute of the solid-state storage media 110. A storage media characteristic for a set of storage cells may be substantially static or may be dynamic and change over time. A storage media characteristic, in one embodiment, includes or relates to a make, a model, a manufacturer, a product version, or the like for the solid-state storage device 102 and/or for the solid-state storage media 110. In another embodiment, a storage media characteristic describes an attribute or statistic for a set of particular storage cells, such as a program/erase cycle count for the set of storage cells, a read count for the set of storage cells, a retention time since a previous write for the set of storage cells, an error statistic for the set of storage cells, or the like. A storage media characteristic, in a further embodiment, may include or relate to an environmental condition or a use of the solid-state storage device 102 and/or of the solid-state storage media 110, such as a temperature, a use case (e.g. a cache use case, an archival use case, a server use case, an enterprise use case, a consumer use case, etc.), or the like.\r\nA storage media characteristic for a set of storage cells affects or informs the determination of a configuration parameter for the set of storage cells. In one embodiment, the storage media characteristics include a program/erase cycle count for a set of storage cells. In another embodiment, the storage media characteristics include a read count for a set of storage cells. The storage media characteristics, in a further embodiment, include a retention time since a previous write for a set of storage cells. In an additional embodiment, the storage media characteristics include a temperature for a set of storage cells. The storage media characteristics, in certain embodiments, include a use case for a set of storage cells. In another embodiment, the storage media characteristics include an error statistic for a set of storage cells, such as an UBER or the like. In a further embodiment, the storage media characteristic may include previous or historical configuration parameters for a set of storage cells, configuration parameters or storage media characteristics for other sets of storage cells, or the like.\r\n\r\nOther storage media characteristics, such as a program/erase cycle counts, read counts, retention times, temperatures, use cases, error statistics, and the like may be dynamic and change frequently.\r\n\r\nThe media characteristic module 502, in certain embodiments, manages the collection of and/or maintenance of storage media characteristics. The media characteristic module 502 may maintain storage media characteristics in and/or retrieve storage media characteristics from a storage media characteristic repository. One example of a storage media characteristic repository is described in greater detail below with regard to FIGS. 7A and 7B. The media characteristic module 502, in certain embodiments, references, determines, and/or manages storage media characteristics for several different sets of storage cells, such as each storage media region or storage media division of the solid-state storage device 102. A storage media region may include an erase block (logical or physical), a page, a logical page, an ECC chunk, a division within a page, a die, a die plane, a chip, or the like."
        },
        {
            "term": "strobe signal",
            "definition": "\"Strobe signal\" refers to a digital electric signal applied to a control line by a driver and configured to raise a voltage and/or current of the control line. In certain embodiments, a strobe signal is configured to oscillate between an elevated level and a non-elevated level, and the oscillation occurs over a regular period defined as cycles. Such oscillating strobe signals may serve as a clock, or clock signal, for transferring data in a digital circuit."
        },
        {
            "term": "structured data",
            "definition": "\"Structured data\" refers to data within a data structure that is organized according to a predefined format, protocol, or configuration such that the structure may be used to facilitate working with the data.  Examples of structured data include, but are not limited to, files, databases, database records, database tables, database schemas, serialized objects, directories, and the like."
        },
        {
            "term": "Temperature sensor v1",
            "definition": "any suitable technology that can implement a temperature sensor, including technology currently employed in conventional memory die temperature sensors. Also, it should be noted that while the temperature sensor may be located in the memory die in this embodiment, the temperature sensor may be located in another component in the storage system, such as the controller, or can be a separate component in the storage system."
        },
        {
            "term": "Temperature sensor v2",
            "definition": "a device, component, circuit, system, logic, chip, or circuitry configured to detect, sense, and/or measure a temperature of an object, an apparatus, a circuit, a component, ambient air, and/or the like. One example of a temperature sensor is a semiconductor based temperature sensor which may be fabricated together with the semiconductor."
        },
        {
            "term": "Temperature sensor v3",
            "definition": "a device, component, circuit, system, chip, or circuitry configured to detect, sense, and/or measure a temperature of a thing, an apparatus, a circuit, a component, and/or the like."
        },
        {
            "term": "threshold",
            "definition": "\"Threshold\" refers to a level, point, or value above which a condition is true or will take place and below which the condition is not true or will not take place, or vice versa. (Search \"threshold\" on Merriam-Webster.com. Merriam-Webster, 2019. Web. 14 Nov. 2019. Modified.)"
        },
        {
            "term": "unstructured data",
            "definition": "\"Unstructured data\" refers to data stored without a particular organization, predefined format, protocol, or configuration.  Examples of unstructured data include, but are not limited to, content of a text message, content of an email message, text content of a file, content of a document, and the like."
        },
        {
            "term": "valid data",
            "definition": "\"Valid data\" refers to data of a data block that was stored by a host or other user of a storage device, and should be preserved and maintained until the host indicates that the data of the data block is no longer needed, and either can, or should be, deleted."
        },
        {
            "term": "word line",
            "definition": "\"Word line\" refers to a structure within a memory array comprising a set of memory cells. The memory array is configured such that the operational memory cells of the word line are read or sensed during a read operation. Similarly, the memory array is configured such that the operational memory cells of the word line are read, or sensed, during a read operation. A word line may also be referred to as a physical page or page for short. A physical word line may span a single plane within a memory die. Two or more physical word lines, for example on the same row of a non-volatile memory array may form a logical word line, also referred to as a logical page."
        },
        {
            "term": "Write once storage media",
            "definition": "a storage media such as a storage cell that is reinitialized (e.g., erased) before new data or a change to the data is written or programmed thereon. In other words, data of a write once storage media cannot be overwritten, the write once storage media must be erased before subsequently writing data to the write once storage media."
        },
        {
            "term": "XOR module",
            "definition": "\"XOR module\" refers to any hardware, circuit, component, module, logic, device, or apparatus configured, programmed, designed, arranged, or engineered to compute, modify, adjust, or calculate XOR parity data. In certain embodiments, the XOR module applies a binary XOR function to two operands and produces a result which is the bitwise XOR of both operands."
        },
        {
            "term": "XOR parity data",
            "definition": "\"XOR parity data\" refers to a particular type of parity data. Parity data refers to one or more bits associated with a string of binary code (set of ordered binary bits). Parity bits, and parity data, may be used as the simplest form of error detecting code. Parity bits, and parity data, may generally be applied to the smallest units of a communication protocol or data being exchanged, typically 8-bit octets (a byte), although parity data can also be applied separately to an entire message string of bits or set of data. (Search \"parity bit\" on Wikipedia.com May 9, 2020. Modified. Accessed May 20, 2020.)XOR parity data is a particular type of parity data that may be used to leverage a property of an XOR operation in which an XOR operation is its own inverse. XOR parity data may be combined for multiple sets of commonly configured data to enable error correction of the data through a reverse XOR operation. This combining is referred to herein as accumulating XOR parity data (e.g., accumulating XOR parity data).In certain embodiments, XOR parity data may comprise an XOR result from a bitwise XOR operation of a string of binary data being protected and another XOR result or an initial parity data set, such as a set of zeros. XOR parity data may also be used with the XOR binary function to recover a set of data, provided a copy of each data set used to generate an XOR parity data result is available except for the data set being recovered."
        }
    ]
}